Argonne National Laboratory

2012 APS/CNM/EMC Users Meeting
May 7-10, 2012

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EMC Plenary
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Tuesday, May 8, 2012

Workshop C: "Imaging at All Length and Time Scales"
Organizers: Kamel Fezzaa (XSD), Nathan Guisinger (CNM), and Marc De Graef (Carnegie Mellon University)

Location: APS 402 Lecture Hall

The ability to understand, modify, and control systems in a variety of environments across multiple time and length scales is central to many fundamental contemporary research and engineering challenges. Success in these efforts hinges on the ability to image not only the structure in systems, but also the electronic, magnetic, optical and chemical properties and behavior associated with this structure. The APS, CNM and EMC possess a diverse and complementary array of imaging, microscopy and spectroscopy platforms to push this frontier of multiscale and time-resolved investigation. Going forward, it will become more important to establish multimodal imaging capabilities focusing on new techniques and the use of novel tool combinations to address the next generation of research challenges.

08:45 -- 09:00

Welcome & Introductory Remarks

09:00 -- 09:40

Shengnian Luo (Los Alamos National Laboratory)
Temporally and Spatially Resolved Dynamic Phase-contrast Imaging with Individual Synchrotron X-ray Pulses under Shock Loading

09:40 -- 10:20

Xianghui Xiao (Argonne National Laboratory)
Fast Microtromography/Micro-imaging and Applications at APS/2-BM

10:20 -- 10:50


10:50 -- 11:30

Wilson K.S. Chiu (University of Conneticut)
Full-field 3D Imaging and Analysis of Heterogeneous Functional Materials (HeteroFoaMs) for Energy Systems

11:30 -- 12:10

Peter Sutter (Brookhaven National Laboratory)
In-situ Microscopy on 2D Materials: Growth, Processing, Properties

12:10 -- 01:30


01:30 -- 02:10

Phillip First (Georgia Institute of Technology)
Local Measurements of the Electronic Properties of Epitaxial Graphene

02:10 -- 02:50

Paul Kotula (Sandia National Laboratory)
Progress with a Probe-corrected Analytical Electron Microscope with 0.7sr Integral SDD Array

02:50 --03:20


03:20 -- 04:00

Geoff Campbell (Lawrence Livermore National Laboratory)
Quantifying Transient Dynamics in Materials Using Time-resolved in situ TEM

04:00 -- 04:40 Christian Kisielowski (NCEM/LBL, Lawrence Berkeley National Laboratory)
The Ongoing Transformation of Atomic-resolution Transmission Electron Microscopy





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